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Impact of negative bias temperature instability on digital circuit reliability.

Vijay ReddyAnand T. KrishnanAndrew MarshallJohn RodriguezSreedhar NatarajanTim RostSrikanth Krishnan
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • digital circuits
  • circuit design
  • positive and negative
  • data flow
  • analog circuits
  • database
  • query processing
  • finite state machines