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Impact of negative bias temperature instability on digital circuit reliability.
Vijay Reddy
Anand T. Krishnan
Andrew Marshall
John Rodriguez
Sreedhar Natarajan
Tim Rost
Srikanth Krishnan
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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digital circuits
circuit design
positive and negative
data flow
analog circuits
database
query processing
finite state machines