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Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current.

Hariram MohanramHarikrishnan KumarasamyChoong-Un KimYoung-Joon ParkSrikanth Krishnan
Published in: IRPS (2024)
Keyphrases
  • high density
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