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Process and Reliability Sensors for Nanoscale CMOS.

John KeaneChris H. KimQunzeng LiuSachin S. Sapatnekar
Published in: IEEE Des. Test Comput. (2012)
Keyphrases
  • real time
  • real world
  • database
  • databases
  • learning algorithm
  • artificial intelligence
  • search engine
  • image processing
  • video sequences
  • evolutionary algorithm
  • sensor networks
  • development process