Login / Signup
Process and Reliability Sensors for Nanoscale CMOS.
John Keane
Chris H. Kim
Qunzeng Liu
Sachin S. Sapatnekar
Published in:
IEEE Des. Test Comput. (2012)
Keyphrases
</>
real time
real world
database
databases
learning algorithm
artificial intelligence
search engine
image processing
video sequences
evolutionary algorithm
sensor networks
development process