Subhadip Kundu

Publication Activity (10 Years)

Years Active: 2008-2024
Publications (10 Years): 8

Top Topics

Fault Diagnosis

Model Based Diagnosis

Medical Diagnosis

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Subhadip Kundu, Jais Abraham
Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network. VLSID (2024)
Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan
Using Custom Fault Models to Improve Understanding of Silicon Failures. ITC (2022)
Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur
Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set. ITC (2017)
Kanad Basu, Subhadip Kundu
Post-Silicon Validation and Diagnosis. VLSI Design (2016)
Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur
Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. ITC (2016)
Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay, Bijit Kumar Das
A hardware based low temperature solution for VLSI testing using decompressor side masking. ISCAS (2015)
Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur
Fault diagnosis in designs with extreme low pin test data compressors. DATE (2015)
Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment. IEEE Trans. Very Large Scale Integr. Syst. 23 (7) (2015)
Subhadip Kundu, Aniket Jha, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. IEEE Trans. Very Large Scale Integr. Syst. 22 (3) (2014)
Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. ETS (2013)
Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (11) (2013)
Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay
Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Asian Test Symposium (2013)
Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
An ATE assisted DFD technique for volume diagnosis of scan chains. DAC (2013)
S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay
Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing. Integr. 45 (2) (2012)
Tapas Kumar Maiti, Subhadip Kundu, Arpita Dutta, Santanu Chattopadhyay
Confidence Based Power Aware Testing. ISED (2012)
Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. VLSI Design (2012)
Bibhas Ghoshal, Subhadip Kundu, Indranil Sengupta, Santanu Chattopadhyay
Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip. VDAT (2012)
Subhadip Kundu, Santanu Chattopadhyay
Efficient don't care filling and scan chain masking for low-power testing. Int. J. Comput. Aided Eng. Technol. 4 (2) (2012)
Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. VLSI Design (2011)
S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay
Customizing pattern set for test power reduction via improved X-identification and reordering. ISLPED (2010)
Subhadip Kundu, Santanu Chattopadhyay
Efficient Don't Care Filling for Power Reduction during Testing. ARTCom (2009)
Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay
Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. Asian Test Symposium (2009)
Subhadip Kundu, Santanu Chattopadhyay, Kanchan Manna
A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing. ICIIS (2008)