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Customizing pattern set for test power reduction via improved X-identification and reordering.

S. Krishna KumarS. KaundinyaSubhadip KunduSantanu Chattopadhyay
Published in: ISLPED (2010)
Keyphrases
  • power reduction
  • power consumption
  • low power
  • power saving
  • pattern set
  • low cost
  • data mining
  • real world
  • computer vision
  • image processing
  • sensor networks