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Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set.

Subhadip KunduKuldip KumarRishi KumarRohit Kapur
Published in: ITC (2017)
Keyphrases
  • test set
  • error rate
  • training set
  • training data
  • test data
  • data structure
  • model based diagnosis
  • evaluation methodology
  • computer vision
  • random selection
  • model selection
  • class distribution