Efficient don't care filling and scan chain masking for low-power testing.

Subhadip Kundu Santanu Chattopadhyay

Published in: Int. J. Comput. Aided Eng. Technol. (2012)

Keyphrases

low power
power consumption
low cost
high speed
single chip
digital signal processing
high power
wireless transmission
real time
logic circuits
vlsi architecture
efficient implementation
highly efficient
energy dissipation
vlsi circuits