Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM.

Sina Bakhtavari Mamaghani Jongsin Yun Martin Keim Mehdi B. Tahoori

Published in: VTS (2024)

Keyphrases

test suite
computer vision
knowledge base
information technology
set of test cases
learning algorithm
image processing
database systems
neural network
artificial intelligence
evolutionary algorithm
test cases