Jongsin Yun

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 8

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Publications

Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim
MBIST-based weak bit screening method for embedded MRAM. ETS (2024)
Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. VTS (2024)
Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim
Transitioning eMRAM from Pilot Project to Volume Production. ITC (2023)
Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
Smart Hammering: A practical method of pinhole detection in MRAM memories. DATE (2023)
Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
MBIST-based Trim-Search Test Time Reduction for STT-MRAM. VTS (2022)
Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. ETS (2021)
Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. ITC (2020)
Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa
MBIST Support for Reliable eMRAM Sensing. ETS (2020)