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IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair.

Erik Jan MarinissenVineet PancholiPo-Yao ChuangMartin Keim
Published in: VTS (2024)
Keyphrases
  • software engineering
  • case study
  • development process
  • high speed
  • decision support
  • information processing
  • test data
  • software testing