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Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits.
Martin Keim
Nicole Drechsler
Rolf Drechsler
Bernd Becker
Published in:
J. Electron. Test. (2001)
Keyphrases
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high quality
computational cost
empirical studies
preprocessing
significant improvement
reinforcement learning
ground truth
database
data mining
high level
benchmark datasets
machine learning methods
parallel algorithm
computationally expensive
statistical tests