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Heguo Yin
Publication Activity (10 Years)
Years Active: 2024-2024
Publications (10 Years): 1
Top Topics
Root Cause
Conducted An Empirical Study
Access Control
Top Venues
ETS
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Publications
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Heguo Yin
,
Peter Poechmueller
Semiconductor Application Fail Root Causes And Secure Test Remedy.
ETS
(2024)