Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
Kihyuk HanJoonsung ParkJae Wook LeeJaeyong ChungEonjo ByunCheol-Jong WooSejang OhJacob A. AbrahamPublished in: J. Electron. Test. (2011)
Keyphrases
- physical design
- single chip
- chip design
- circuit design
- built in self test
- vlsi implementation
- programmable logic
- low cost
- evolvable hardware
- high speed
- analog vlsi
- ultra low power
- vlsi design
- host computer
- functional verification
- low power
- mixed signal
- case study
- power dissipation
- high density
- design methodology
- computer aided
- design process
- evolutionary algorithm
- cmos technology
- printed circuit boards
- statistical tests
- embedded systems
- test cases
- data sets
- phase locked loop