Cheol-Jong Woo

Publication Activity (10 Years)

Years Active: 2009-2011
Publications (10 Years): 0

Publications

Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27 (4) (2011)
Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. VTS (2010)
Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium (2010)
Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo
A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. ETS (2010)
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. ETS (2009)