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A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control.
Hyunjin Kim
Jaeyong Chung
Jacob A. Abraham
Eonjo Byun
Cheol-Jong Woo
Published in:
ETS (2010)
Keyphrases
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high speed
real time
optimal control
classification scheme
control theory
image sequences
control system
response time
control strategy
multiscale
data structure
input output
power consumption
main memory
garbage collection