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Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate.
Jaeyong Chung
Joonsung Park
Jacob A. Abraham
Eonjo Byun
Cheol-Jong Woo
Published in:
VTS (2010)
Keyphrases
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damage assessment
optimal solution
failure rate
low cost
closed form
preventive maintenance
database systems
np hard
high speed
memory requirements
statistical tests
memory space
memory size
memory footprint
storage overhead