Enhanced algorithm of combining trace and scan signals in post-silicon validation.
Kihyuk HanJoon-Sung YangJacob A. AbrahamPublished in: VTS (2013)
Keyphrases
- detection algorithm
- computational complexity
- preprocessing
- optimal solution
- cost function
- dynamic programming
- times faster
- computationally efficient
- np hard
- computational cost
- learning algorithm
- optimization algorithm
- segmentation algorithm
- low cost
- k means
- evolutionary algorithm
- data sets
- probabilistic model
- worst case
- experimental evaluation
- linear programming
- significant improvement
- theoretical analysis
- objective function
- ant colony optimization