A Proactive System for Voltage-Droop Mitigation in a 7-nm Hexagon™ Processor.
Vijay Kiran KalyanamEric MahurinKeith A. BowmanJacob A. AbrahamPublished in: IEEE J. Solid State Circuits (2021)
Keyphrases
- metal oxide
- power system
- high speed
- parallel processing
- low voltage
- context aware
- instruction set
- computer architecture
- transmission line
- cmos technology
- electric field
- dynamic random access memory
- single chip
- x ray
- real time
- risk management
- correlation function
- high voltage
- power losses
- agent teamwork
- processor core
- solid state
- parallel processors
- power supply