Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded Processor.
Vijay Kiran KalyanamEric MahurinMichael SpenceJacob A. AbrahamPublished in: ITC (2020)
Keyphrases
- test sequences
- multi threaded
- multi core processors
- computer architecture
- multithreading
- test cases
- operating system
- video sequences
- bit rate
- parallel programming
- parallel computing
- test generation
- computing resources
- parallel processing
- real time
- gene expression programming
- power system
- highly efficient
- computational power
- coarse grained
- databases
- information flow
- parallel algorithm
- test suite
- fine grained
- genetic programming
- decision trees
- computer vision
- artificial intelligence
- database