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A 0.1-3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS.
Immanuel Raja
Gaurab Banerjee
Mohamad A. Zeidan
Jacob A. Abraham
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
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duty cycle
clock frequency
cmos technology
power consumption
high speed
low power
nm technology
real time
low voltage
low cost
parallel processing
silicon on insulator
metal oxide semiconductor
image sensor
scheduling problem
hardware and software
frame rate
fault tolerance
data structure