A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement.

Hyunjin Kim Jacob A. Abraham

Published in: J. Electron. Test. (2012)

Keyphrases

built in self test
integrated circuit
memory requirements
garbage collection
information systems
data sets
artificial intelligence
memory space
bloom filter
social networks
website
multiscale
human computer interaction
computational power
representation scheme
detection scheme
secret sharing scheme
neural network