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Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below.

Andrzej J. StrojwasJacob A. AbrahamHong HaoMax M. Shulaker
Published in: VTS (2016)
Keyphrases
  • keynote address
  • lessons learned
  • united kingdom
  • united states
  • language technology
  • learning environment
  • computer science
  • computer science education
  • computing education