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Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach.

Esther GoudetFabio SureauPaul BreuilLuis Peña TreviñoLirida A. B. NavinerJean-Marc DaveauPhilippe Roche
Published in: J. Electron. Test. (2024)
Keyphrases
  • graph partitioning
  • failure rate
  • partitioning algorithm
  • information retrieval
  • object recognition
  • probabilistic model
  • generative model