Xingna Hou

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 6

Top Topics

Convolutional Neural Network

Attention Mechanism

Defect Detection

Detection Method

Top Venues

Expert Syst. Appl.

J. Electron. Test.

Publications

Shouhong Chen, Zhentao Huang, Tao Wang, Xingna Hou, Jun Ma
Mixed-type wafer defect detection based on multi-branch feature enhanced residual module. Expert Syst. Appl. 242 (2024)
Shouhong Chen, Tao Wang, Zhentao Huang, Xingna Hou
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field. J. Electron. Test. 39 (5) (2023)
Shouhong Chen, Meiqi Liu, Xingna Hou, Ziren Zhu, Zhentao Huang, Tao Wang
Wafer map defect pattern detection method based on improved attention mechanism. Expert Syst. Appl. 230 (2023)
Shouhong Chen, Tao Wang, Zhentao Huang, Xingna Hou
Detection method of Golden Chip-Free Hardware Trojan based on the combination of ResNeXt structure and attention mechanism. Comput. Secur. 134 (2023)
Shouhong Chen, Yuxuan Zhang, Xingna Hou, Yuling Shang, Ping Yang
Wafer map failure pattern recognition based on deep convolutional neural network. Expert Syst. Appl. 209 (2022)
Shouhong Chen, Huaiqiang Kang, Jun Ma, Ling Guo, Xingna Hou
Research on TSV Void Defects Based on Machine Learning. CSAE (2019)