Research on TSV Void Defects Based on Machine Learning.
Shouhong ChenHuaiqiang KangJun MaLing GuoXingna HouPublished in: CSAE (2019)
Keyphrases
- machine learning
- pattern recognition
- machine learning algorithms
- text classification
- learning algorithm
- computer vision
- explanation based learning
- feature selection
- supervised classification
- decision trees
- computational biology
- machine learning approaches
- knowledge representation
- supervised learning
- kernel methods
- machine learning methods
- knowledge acquisition
- active learning
- computational intelligence
- artificial intelligence
- data mining
- neural network
- databases
- data analysis
- search algorithm
- support vector
- learning systems
- knowledge base
- search engine
- learning tasks
- inductive learning
- genetic algorithm