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Wafer map defect pattern detection method based on improved attention mechanism.

Shouhong ChenMeiqi LiuXingna HouZiren ZhuZhentao HuangTao Wang
Published in: Expert Syst. Appl. (2023)
Keyphrases
  • detection method
  • attention mechanism
  • face detection
  • detection algorithm
  • feature detection
  • region detection
  • visual attention
  • computer vision
  • high level
  • saliency map