Independent component analysis-based defect detection in patterned liquid crystal display surfaces.

Chi-Jie Lu Du-Ming Tsai

Published in: Image Vis. Comput. (2008)

Keyphrases

defect detection
independent component analysis
liquid crystal displays
thin film transistor
tft lcd
principal component analysis
independent components
signal processing
factor analysis
feature extraction
blind source separation
image formation
pattern recognition
eye tracking
motion blur
linear programming