Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion.
Du-Ming TsaiChih-Chieh ChangShin-Min ChaoPublished in: Image Vis. Comput. (2010)
Keyphrases
- anisotropic diffusion
- partial differential equations
- edge preserving
- noise removal
- edge detection
- diffusion process
- bilateral filtering
- integrated circuit
- edge enhancement
- diffusion tensor
- input image
- diffusion model
- diffusion equation
- nonlinear filtering
- diffusion coefficient
- structure tensor
- adaptive smoothing
- edge preservation
- impulse noise removal
- fourth order
- image denoising
- image analysis
- robust statistical
- multiscale
- image processing
- computer vision