Wavelet-based defect detection in solar wafer images with inhomogeneous texture.
Wei-Chen LiDu-Ming TsaiPublished in: Pattern Recognit. (2012)
Keyphrases
- defect detection
- textured surfaces
- image data
- texture information
- image database
- original images
- image composition
- extracted from images
- input image
- three dimensional
- image regions
- image analysis
- texture mapping
- image structure
- image features
- image statistics
- object recognition
- image classification
- image compression
- lighting conditions
- texture classification
- filtered images
- viewing conditions
- feature extraction
- gabor filters
- image retrieval
- image registration
- texture features
- synthesized images
- feature vectors
- edge detection
- image texture
- image edges
- image content
- color features
- image decomposition
- intensity variations
- texture analysis
- multi band
- image collections
- illumination conditions