TEXTURE INFORMATION
Experts
- Matti Pietikäinen
- Michal Haindl
- P. Nagabhushan
- Guoying Zhao
- Alice Porebski
- Nicolas Vandenbroucke
- Loris Nanni
- Tieniu Tan
- Alessandra Lumini
- Mohammed Javed
- Thrasyvoulos N. Pappas
- André Ricardo Backes
- David Zhang
- Shervan Fekri Ershad
- Aaron Fenster
- Li Liu
- Yong Man Ro
- Sheryl Brahnam
- Umapada Pal
- Maria Petrou
- Paul W. Fieguth
- Francesco Bianconi
- Abdenour Hadid
- Vojtech Havlícek
- Ahmed Bouridane
- Topi Mäenpää
- B. B. Chaudhuri
- Jesús Chamorro-Martínez
- Paolo Napoletano
- Gerald Schaefer
- Shogo Okamoto
- Liming Chen
- Antonio Fernández
- Daniel Cohen-Or
- Raimondo Schettini
- Jane You
- Seungmoon Choi
- Yoji Yamada
- Glenn Healey
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- IGARSS
- ICASSP
- IEEE Trans. Image Process.
- IEEE Access
- CVPR
- J. Electronic Imaging
- Medical Imaging: Image Processing
- ISBI
- Comput. Graph. Forum
- Expert Syst. Appl.
- BMVC
- Remote. Sens.
- EUSIPCO
- Neurocomputing
- Sensors
- ICIP (3)
- Image Vis. Comput.
- Vis. Comput.
- ICCV
- Medical Imaging: Computer-Aided Diagnosis
- ACM Trans. Graph.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCNN
- Int. J. Pattern Recognit. Artif. Intell.
- SMC
- J. Vis. Commun. Image Represent.
- SITIS
- ICME
- ICIP (1)
- Signal Process.
- Comput. Vis. Image Underst.
- EMBC
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