TEXTURE CLASSIFICATION
Experts
- Matti Pietikäinen
- Odemir Martinez Bruno
- Guoying Zhao
- André Ricardo Backes
- João Batista Florindo
- Tieniu Tan
- David Zhang
- Li Liu
- Odemir M. Bruno
- Paul W. Fieguth
- Francesco Bianconi
- Adrien Depeursinge
- Domenec Puig
- Andreas Uhl
- Ahmed Bouridane
- Abdenour Hadid
- Constantinos S. Pattichis
- Alice Porebski
- Gerald Schaefer
- Nicolas Vandenbroucke
- Yannick Berthoumieu
- Yongsheng Dong
- Shervan Fekri Ershad
- Yassine Ruichek
- Niraj P. Doshi
- Thrasyvoulos N. Pappas
- Antonio Fernández
- Wesley Nunes Gonçalves
- Lei Zhang
- Maria Petrou
- Michal Haindl
- Loris Nanni
- Azriel Rosenfeld
- Yuan Yan Tang
- Timo Ojala
- Josef Kittler
- Despina Kontos
- Paolo Napoletano
- Partha Pratim Roy
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- ICPR
- ICASSP
- IEEE Trans. Image Process.
- IEEE Access
- IGARSS
- CVPR
- Expert Syst. Appl.
- Sensors
- Neurocomputing
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- IEEE Trans. Geosci. Remote. Sens.
- EUSIPCO
- Medical Imaging: Image Processing
- Medical Imaging: Computer-Aided Diagnosis
- ISBI
- EMBC
- Vis. Comput.
- Image Vis. Comput.
- ICIP (3)
- BMVC
- IET Image Process.
- Pattern Anal. Appl.
- Comput. Graph. Forum
- IEEE Signal Process. Lett.
- Biomed. Signal Process. Control.
- CIARP
- J. Vis. Commun. Image Represent.
- Int. J. Pattern Recognit. Artif. Intell.
- SIU
- SMC
- Comput. Methods Programs Biomed.
- ICIP (2)
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