A quantile-quantile plot based pattern matching for defect detection.

Du-Ming Tsai Cheng-Hsiang Yang

Published in: Pattern Recognit. Lett. (2005)

Keyphrases

pattern matching
defect detection
regular expressions
central limit theorem
tree matching
feature extraction
matching process
pattern matching algorithm
string matching
hamming distance
data sets
databases
textured surfaces
boyer moore
graph matching
matching strategy