Jiefei Gu

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 5

Top Topics

Defect Detection

Sparse Reconstruction

Predicate Logic

Feature Extractor

Top Venues

IEEE Trans. Instrum. Meas.

IEEE Trans. Ind. Electron.

IEEE Trans. Ind. Informatics

Adv. Eng. Informatics

Publications

Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
Flip-chip solder bumps defect detection using a self-search lightweight framework. Adv. Eng. Informatics 60 (2024)
Siyu Zhang, Lei Su, Jiefei Gu, Ke Li, Weitian Wu, Michael G. Pecht
Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection. Expert Syst. Appl. 238 (Part B) (2024)
Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection. IEEE Trans. Ind. Informatics 20 (8) (2024)
Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht
A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE Trans. Instrum. Meas. 72 (2023)
Lei Su, Xiaonan Yu, Ke Li, Jiefei Gu, Michael G. Pecht
Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation. IEEE Trans. Ind. Electron. 68 (10) (2021)