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Flip-chip solder bumps defect detection using a self-search lightweight framework.

Yu SunLei SuJiefei GuXinwei ZhaoKe LiMichael G. Pecht
Published in: Adv. Eng. Informatics (2024)
Keyphrases
  • lightweight
  • defect detection
  • search space
  • search algorithm
  • rfid tags
  • mobile devices
  • high speed
  • cost effective
  • handheld devices
  • dos attacks