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Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection.
Yu Sun
Lei Su
Jiefei Gu
Xinwei Zhao
Ke Li
Michael G. Pecht
Published in:
IEEE Trans. Ind. Informatics (2024)
Keyphrases
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feature extractor
defect detection
feature extraction
feature values
high dimensional
machine learning
sparse representation
recognition scheme
neural network
image processing
object recognition
expert systems
higher order
high frequency