F. Patrick McCluskey

Publication Activity (10 Years)

Years Active: 2006-2018
Publications (10 Years): 4

Top Topics

Film Restoration

Defect Detection

Reliability Assessment

Top Venues

Microelectron. Reliab.

Publications

Shuji Nishimoto, Seyed Ali Moeini, Toyo Ohashi, Yoshiyuki Nagatomo, F. Patrick McCluskey
Novel silver die-attach technology on silver pre-sintered DBA substrates for high temperature applications. Microelectron. Reliab. 87 (2018)
Subramani Manoharan, Chandradip Patel, Stevan Hunter, F. Patrick McCluskey
Mechanism of wire bond shear testing. Microelectron. Reliab. (2018)
Nga Man Li, Subramani Manoharan, Diganta Das, F. Patrick McCluskey
Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs). Microelectron. Reliab. (2018)
Subramani Manoharan, Chandradip Patel, F. Patrick McCluskey, Michael G. Pecht
Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment. Microelectron. Reliab. 84 (2018)
David Squiller, Hannes Greve, Elena Mengotti, F. Patrick McCluskey
Physics-of-failure assessment methodology for power electronic systems. Microelectron. Reliab. 54 (9-10) (2014)
P. Quintero, F. Patrick McCluskey, B. Koene
Thermomechanical reliability of a silver nano-colloid die attach for high temperature applications. Microelectron. Reliab. 54 (1) (2014)
F. Patrick McCluskey, N. M. Li, Elena Mengotti
Eliminating infant mortality in metallized film capacitors by defect detection. Microelectron. Reliab. 54 (9-10) (2014)
F. Patrick McCluskey, M. Dash, Z. Wang, D. Huff
Reliability of high temperature solder alternatives. Microelectron. Reliab. 46 (9-11) (2006)