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Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment.

Subramani ManoharanChandradip PatelF. Patrick McCluskeyMichael G. Pecht
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • reliability assessment
  • thin film
  • real time
  • computer vision
  • data mining
  • information retrieval
  • genetic algorithm
  • decision trees
  • high quality
  • multiscale
  • evolutionary algorithm
  • power system