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Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment.
Subramani Manoharan
Chandradip Patel
F. Patrick McCluskey
Michael G. Pecht
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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reliability assessment
thin film
real time
computer vision
data mining
information retrieval
genetic algorithm
decision trees
high quality
multiscale
evolutionary algorithm
power system