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Thermomechanical reliability of a silver nano-colloid die attach for high temperature applications.
P. Quintero
F. Patrick McCluskey
B. Koene
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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high temperature
nano scale
reliability assessment
data mining
failure rate
data sets
artificial intelligence
computer vision
input output
electron microscopy
silicon dioxide