Diganta Das

Publication Activity (10 Years)

Years Active: 1996-2023
Publications (10 Years): 10

Top Topics

Mechanical Properties

Mahalanobis Distance

Banking Industry

Anomaly Detection

Top Venues

Microelectron. Reliab.

IEEE Trans. Ind. Informatics

Publications

Omri Matania, Lior Bachar, Varun Khemani, Diganta Das, Michael H. Azarian, Jacob Bortman
One-fault-shot learning for fault severity estimation of gears that addresses differences between simulation and experimental signals and transfer function effects. Adv. Eng. Informatics 56 (2023)
Aishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht
An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics. IEEE Access 9 (2021)
Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors. IEEE Access 9 (2021)
Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor. IEEE Access 8 (2020)
Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood
Evaluating Impact of Information Uncertainties on Component Reliability Assessment. IRPS (2019)
Lidia Al-Zogbi, Diganta Das, Peter Rundle, Michael G. Pecht
Breaking the Trust: How Companies Are Failing Their Customers. IEEE Access 7 (2019)
Guanghua Wu, Meixian Jiang, Diganta Das, Michael G. Pecht
ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints. IEEE Access 7 (2019)
Nga Man Li, Subramani Manoharan, Diganta Das, F. Patrick McCluskey
Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs). Microelectron. Reliab. (2018)
Yi Wan, Hailong Huang, Diganta Das, Michael G. Pecht
Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process. Microelectron. Reliab. 56 (2016)
Nishad Patil, Diganta Das, Michael G. Pecht
Anomaly detection for IGBTs using Mahalanobis distance. Microelectron. Reliab. 55 (7) (2015)
Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht
Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test. IEEE Trans. Ind. Informatics 10 (3) (2014)
Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht
Long term storage reliability of antifuse field programmable gate arrays. Microelectron. Reliab. 53 (12) (2013)
Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht
Light emitting diodes reliability review. Microelectron. Reliab. 52 (5) (2012)
Nishad Patil, Diganta Das, Michael G. Pecht
A prognostic approach for non-punch through and field stop IGBTs. Microelectron. Reliab. 52 (3) (2012)
Shunfeng Cheng, Diganta Das, Michael G. Pecht
Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations. ICBO (2011)
Jun Dai, Diganta Das, Michael G. Pecht
Prognostics-based health management for telecom equipment under free air cooling. EUROCON (2011)
Nishad Patil, Diganta Das, Michael G. Pecht
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics. ISPE CE (2010)
Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht
Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics. IEEE Trans. Reliab. 58 (2) (2009)
Michael G. Pecht, Diganta Das, Arun Ramakrishnan
The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectron. Reliab. 42 (9-11) (2002)
Diganta Das, Satyandra K. Gupta, Dana S. Nau
Generating redesign suggestions to reduce setup cost: a step towards automated redesign. Comput. Aided Des. 28 (10) (1996)