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The IEEE standards on reliability program and reliability prediction methods for electronic equipment.
Michael G. Pecht
Diganta Das
Arun Ramakrishnan
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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neural network
computational cost
empirical studies
benchmark datasets
electronic equipment
machine learning
genetic algorithm
artificial intelligence
pattern recognition
significant improvement
machine learning algorithms
machine learning methods
qualitative and quantitative