Sign in
Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process.
Yi Wan
Hailong Huang
Diganta Das
Michael G. Pecht
Published in:
Microelectron. Reliab. (2016)
Keyphrases
</>
high density
markov process
markov chain
stochastic process
low density
higher order
particle filter
steady state