Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound.
Lei SuXiaonan YuKe LiXingyan YaoMichael G. PechtPublished in: IEEE Access (2019)
Keyphrases
- high frequency
- experimental verification
- low frequency
- high frequency components
- visual quality
- high resolution
- high frequencies
- ultrasound images
- edge detection
- wavelet transform
- low pass
- wavelet coefficients
- multi resolution analysis
- frequency band
- subband
- discrete wavelet transform
- wavelet domain
- high pass
- image restoration
- edge information
- blocking artifacts
- motion estimation
- phase shifting
- computer vision
- low bit rate coding