EXPERIMENTAL VERIFICATION
Experts
- Naoki Uchiyama
- Masami Iwase
- Shigenori Sano
- Masaru Uchiyama
- George Nikolakopoulos
- Ahmed S. Elwakil
- Alenka G. Zajic
- Stéphane Donnay
- Georges G. E. Gielen
- Krzysztof Kozlowski
- Kazuo Tsuchiya
- Yushi Shirato
- Yong Li
- Georgia Tsirimokou
- Shinya Aoi
- Yizhar Or
- Xiaofei Li
- Atsushi Ohta
- Masayuki Fujita
- Kazuma Sekiguchi
- Takashi Hikihara
- Nikhil Chopra
- Mustafa Badaroglu
- Thomas G. Pratt
- Kazuki Maruta
- Eric Rogers
- Yury Orlov
- Bo Dong
- Koichi Osuka
- Hugo J. De Man
- Luis T. Aguilar
- Marc van Heijningen
- Kostas Alexis
- Anthony Tzes
- Costas Psychalinos
- Kenichiro Nonaka
- Son Nguyen
- Shin-ichi Hamasaki
- Gordon L. Stüber
Venues
- IEEE Access
- Sensors
- CoRR
- ACC
- IECON
- IEEE Trans. Ind. Electron.
- ICRA
- IROS
- J. Robotics Mechatronics
- IEEE Trans. Instrum. Meas.
- SII
- IEEE Trans. Control. Syst. Technol.
- Robotica
- AIM
- CDC
- OFC
- IEICE Trans. Electron.
- VTC Fall
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Int. J. Bifurc. Chaos
- IEICE Trans. Commun.
- ROBIO
- ICIT
- ISIE
- J. Circuits Syst. Comput.
- ISCAS
- Microelectron. Reliab.
- Symmetry
- ISER
- IEEE Robotics Autom. Lett.
- EMBC
- IAS
- J. Symb. Log.
- ECOC
- Adv. Robotics
- Int. J. Circuit Theory Appl.
- VTC Spring
- AMC
- IEEE J. Solid State Circuits
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