EXPERIMENTAL VERIFICATION
Experts
- Naoki Uchiyama
- Shigenori Sano
- Masami Iwase
- Stéphane Donnay
- George Nikolakopoulos
- Masaru Uchiyama
- Ahmed S. Elwakil
- Alenka G. Zajic
- Kenichiro Nonaka
- Shin-ichi Hamasaki
- Gordon L. Stüber
- Mustafa Badaroglu
- Nikhil Chopra
- Yury Orlov
- Yunong Zhang
- Kazuo Tsuchiya
- Kostas Alexis
- Son Nguyen
- Georges G. E. Gielen
- Anthony Tzes
- Luis T. Aguilar
- Takashi Hikihara
- Kazuki Maruta
- Xiaofei Li
- Hugo J. De Man
- Atsushi Ohta
- Koichi Osuka
- Georgia Tsirimokou
- Masayuki Fujita
- Yushi Shirato
- Shinya Aoi
- Krzysztof Kozlowski
- Marc van Heijningen
- Eric Rogers
- Ryo Takahashi
- Costas Psychalinos
- Thomas G. Pratt
- Kazuma Sekiguchi
- Yong Li
Venues
- IEEE Access
- Sensors
- CoRR
- IECON
- ACC
- IEEE Trans. Ind. Electron.
- ICRA
- IROS
- J. Robotics Mechatronics
- IEEE Trans. Instrum. Meas.
- SII
- Robotica
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- VTC Fall
- CDC
- AIM
- OFC
- IEICE Trans. Electron.
- ISIE
- ICIT
- J. Circuits Syst. Comput.
- Int. J. Bifurc. Chaos
- IEICE Trans. Commun.
- ROBIO
- ISCAS
- ISER
- IEEE Robotics Autom. Lett.
- Microelectron. Reliab.
- EMBC
- Adv. Robotics
- J. Symb. Log.
- IAS
- ECOC
- Symmetry
- IEEE J. Solid State Circuits
- VTC Spring
- AMC
- Int. J. Circuit Theory Appl.
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