Daeil Kwon

Publication Activity (10 Years)

Years Active: 2016-2021
Publications (10 Years): 11

Top Topics

Multiple Hypotheses

Industrial Applications

Health Management

Top Venues

IEEE Trans. Ind. Electron.

Reliab. Eng. Syst. Saf.

Publications

Changyong Lee, Sugyeong Jo, Daeil Kwon, Michael G. Pecht
Capacity-Fading Behavior Analysis for Early Detection of Unhealthy Li-Ion Batteries. IEEE Trans. Ind. Electron. 68 (3) (2021)
Seokgoo Kim, Hyung Jun Park, Jooho Choi, Daeil Kwon
A Novel Prognostics Approach Using Shifting Kernel Particle Filter of Li-Ion Batteries Under State Changes. IEEE Trans. Ind. Electron. 68 (4) (2021)
Jinwoo Lee, Daeil Kwon, Namhun Kim, Changyong Lee
PHM-based wiring system damage estimation for near zero downtime in manufacturing facilities. Reliab. Eng. Syst. Saf. 184 (2019)
Yeong-gwang Oh, Kasin Ransikarbum, Moise Busogi, Daeil Kwon, Namhun Kim
Adaptive SVM-based real-time quality assessment for primer-sealer dispensing process of sunroof assembly line. Reliab. Eng. Syst. Saf. 184 (2019)
Jinwoo Lee, Daeil Kwon, Michael G. Pecht
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management. IEEE Trans. Ind. Electron. 66 (9) (2019)
Kyoungmin Koo, Daeil Kwon
Dynamics of Bubble Behavior in Nucleate Boiling of R134a in an Enhanced Horizontal Tube. IEEE Access 7 (2019)
Insun Shin, Kyoungmin Koo, Daeil Kwon
Development of a Non-Invasive On-Chip Interconnect Health Sensing Method Based on Bit Error Rates. Sensors 18 (10) (2018)
Changyong Lee, Daeil Kwon
A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression. Microelectron. Reliab. 83 (2018)
Shun-Feng Su, Imre J. Rudas, Jacek M. Zurada, Meng Joo Er, Jyh-Horng Chou, Daeil Kwon
Industry 4.0: A Special Section in IEEE Access. IEEE Access 5 (2017)
Jinwoo Lee, Daeil Kwon
A digital technique for diagnosing interconnect degradation by using digital signal characteristics. Microelectron. J. 60 (2017)
Daeil Kwon, Melinda R. Hodkiewicz, Jiajie Fan, Tadahiro Shibutani, Michael G. Pecht
IoT-Based Prognostics and Systems Health Management for Industrial Applications. IEEE Access 4 (2016)