Chunyan Yin

Publication Activity (10 Years)

Years Active: 2003-2021
Publications (10 Years): 8

Top Topics

Failure Modes And Effects

Personal Interests

Statistical Analysis

Top Venues

Microelectron. Reliab.

Int. J. Comput. Intell. Syst.

Multim. Tools Appl.

Comput. Biol. Medicine

Publications

Chunyan Yin, Yongheng Chen, Wanli Zuo
Evolutionary Social Poisson Factorizationfor Temporal Recommendation. Int. J. Comput. Intell. Syst. 14 (1) (2021)
Chang Yan, Peng Li, Changchun Liu, Xinpei Wang, Chunyan Yin, Lianke Yao
Novel gridded descriptors of poincaré plot for analyzing heartbeat interval time-series. Comput. Biol. Medicine 109 (2019)
Fateme Dinmohammadi, David Flynn, Chris Bailey, Michael G. Pecht, Chunyan Yin, Pushparajah Rajaguru, Valentin Robu
Predicting Damage and Life Expectancy of Subsea Power Cables in Offshore Renewable Energy Applications. IEEE Access 7 (2019)
Ana Elsa Hinojosa Herrera, Stoyan Stoyanov, Chris Bailey, Chris Walshaw, Chunyan Yin
Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Comput. Sci. 9 (1) (2019)
Kenneth Chimezie Nwanoro, Hua Lu, Chunyan Yin, Chris Bailey
An analysis of the reliability and design optimization of aluminium ribbon bonds in power electronics modules using computer simulation method. Microelectron. Reliab. 87 (2018)
Yongheng Chen, Chunyan Yin, Yaojin Lin, Wanli Zuo
On-line Evolutionary Sentiment Topic Analysis Modeling. Int. J. Comput. Intell. Syst. 11 (1) (2018)
Yongheng Chen, Chunyan Yin, Yaojin Lin, Wanli Zuo
Multi-modal multi-layered topic classification model for social event analysis. Multim. Tools Appl. 77 (18) (2018)
Chunyan Yin, Chris Best, Chris Bailey, Stoyan Stoyanov
Statistical analysis of the impact of refinishing process on leaded components. Microelectron. Reliab. 55 (2) (2015)
Mahera Musallam, Chunyan Yin, Chris Bailey, C. Mark Johnson
Application of coupled electro-thermal and physics-of-failure-based analysis to the design of accelerated life tests for power modules. Microelectron. Reliab. 54 (1) (2014)
Stoyan Stoyanov, Chris Bailey, M. O. Alam, Chunyan Yin, Chris Best, Peter Tollafield, Rob Crawford, Mike Parker, Jim Scott
Modelling methodology for thermal analysis of hot solder dip process. Microelectron. Reliab. 53 (8) (2013)
Hua Lu, Chris Bailey, Chunyan Yin
Design for reliability of power electronics modules. Microelectron. Reliab. 49 (9-11) (2009)
Chunyan Yin, M. O. Alam, Y. C. Chan, Chris Bailey, Hua Lu
The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications. Microelectron. Reliab. 43 (4) (2003)