FAILURE MODES AND EFFECTS
Experts
- David Parker
- Mark H. Lee
- Yiannis Papadopoulos
- Myron Hecht
- Nicholas R. Jennings
- Paul G. Hawkins
- Neal Andrew Snooke
- Giacomo Bucci
- Luigi Portinale
- Andrea Bondavalli
- Enrico Vicario
- Muhammet Gul
- Kai Meng Tay
- Christian Grante
- Michael J. Wooldridge
- David Kinny
- David J. Woollons
- Julia Pinchak
- Andrea Bobbio
- Irene Bicchierai
- Ola Redell
- M. O. Alam
- Galina Andreeva
- Mohammed Y. Niamat
- Yangquan Chen
- David Baum
- Mehmet Aksit
- Ching-Hsue Cheng
- Mauricio Andrés Polochè Arango
- Muhammad Shafique
- C. Enrique Peláez
- Nicola Dragoni
- Sara Tucci Piergiovanni
- Brigitte Petersen
- Eberle A. Rambo
- Wenjun Zhang
- Michele Minichino
- Douglas J. Leith
- Antony I. T. Rowstron
Venues
- CoRR
- DSN
- Soft Comput.
- SAFECOMP
- Appl. Soft Comput.
- ESM
- Int. J. Comput. Integr. Manuf.
- INTERACT
- Qual. Reliab. Eng. Int.
- J. Oper. Res. Soc.
- Reliab. Eng. Syst. Saf.
- Expert Syst. Appl.
- ACM SIGSOFT Softw. Eng. Notes
- LADC
- ICIBE
- Int. J. Crit. Infrastructures
- Comput. Ind.
- ISSRE Workshops
- Int. J. Crit. Comput. Based Syst.
- Comput. Syst. Sci. Eng.
- Microelectron. Reliab.
- PRDC
- Simul. Model. Pract. Theory
- Artif. Intell. Eng. Des. Anal. Manuf.
- J. Comput. Appl. Math.
- Microprocess. Microsystems
- DYADEM-FTS@EDCC
- HASE
- Bioinform.
- Int. J. Adv. Oper. Manag.
- ICASSP
- PNPM
- EKAW
- JURIX
- ENASE
- WEA
- WADS
- IRI
- ICCSA (2)
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