FAILURE MODES AND EFFECTS
Experts
- Mark H. Lee
- Myron Hecht
- David Parker
- Yiannis Papadopoulos
- Paul G. Hawkins
- Neal Andrew Snooke
- David J. Woollons
- David Kinny
- Nicholas R. Jennings
- Christian Grante
- Enrico Vicario
- Irene Bicchierai
- Andrea Bondavalli
- Julia Pinchak
- Luigi Portinale
- Kai Meng Tay
- Michael J. Wooldridge
- Giacomo Bucci
- Muhammet Gul
- Andrea Bobbio
- Muhammad Shafique
- Elisabeth A. Nguyen
- Lie Meng Pang
- Morayo Adedjouma
- Stefano Pagnotta
- Thanatorn Chuenyindee
- Seyyed Habibollah Mirghafoori
- Alberto Marchisio
- Mohamed Kassab
- Jiafu Su
- Zefu Lin
- Jack W. Heal
- Mario Dal Cin
- Paul Kai-On Chow
- Farhad Deneshgar
- Chen-Peng Hsu
- K. Mathiyazhagan
- David Baum
- Xiao Yao
Venues
- CoRR
- DSN
- SAFECOMP
- Appl. Soft Comput.
- Soft Comput.
- ESM
- Qual. Reliab. Eng. Int.
- INTERACT
- Comput. Syst. Sci. Eng.
- J. Oper. Res. Soc.
- ISSRE Workshops
- Int. J. Crit. Infrastructures
- LADC
- ACM SIGSOFT Softw. Eng. Notes
- Int. J. Comput. Integr. Manuf.
- ICIBE
- Int. J. Crit. Comput. Based Syst.
- Expert Syst. Appl.
- Reliab. Eng. Syst. Saf.
- Microelectron. Reliab.
- Comput. Ind.
- Eur. J. Oper. Res.
- Inf. Sci.
- Comput. Sci. Rev.
- ICECCS
- CMMR
- EMS
- J. Intell. Manuf.
- Agents
- IEEE Trans. Computers
- J. Imaging
- SISY
- ICCSA (2)
- FLAIRS Conference
- DYADEM-FTS@EDCC
- PRDC
- Int. J. Circuit Theory Appl.
- WADS
- RTSI
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