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Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.

Ioannis MessarisTheano A. KaratsoriNikolaos FasarakisChristoforos G. TheodorouSpiros NikolaidisGérard GhibaudoC. A. Dimitriadis
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • artificial intelligence
  • multi channel
  • real time
  • real world
  • genetic algorithm
  • information systems
  • expert systems
  • modeling method
  • modeling framework
  • multiple input