Christoforos G. Theodorou

Publication Activity (10 Years)

Years Active: 2009-2023
Publications (10 Years): 11

Top Topics

Top Venues

Microelectron. Reliab.

Publications

F. Serra Di Santa Maria, Francis Balestra, Christoforos G. Theodorou, Gérard Ghibaudo, Cezar B. Zota, Eunjung Cha
Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K. IRPS (2023)
F. Serra Di Santa Maria, Christoforos G. Theodorou, Francis Balestra, Gérard Ghibaudo, Eunjung Cha, Cezar B. Zota
In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications. ESSDERC (2022)
Angeliki Tataridou, Christoforos G. Theodorou
Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs. MOCAST (2022)
Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou
VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits. ESSDERC (2021)
Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou
"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs. IRPS (2021)
Petros Sideris, Arnaud Peizerat, Perrine Batude, Christoforos G. Theodorou, Gilles Sicard
Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels. MOCAST (2021)
Theano A. Karatsori, K. Bennamane, Christoforos G. Theodorou, L. Czornomaz, Jean Fompeyrine, Cezar B. Zota, Clarissa Convertino, Gérard Ghibaudo
Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator. ESSDERC (2018)
R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo
Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. ESSDERC (2016)
Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. Microelectron. Reliab. 56 (2016)
Christoforos G. Theodorou, Mouenes Fadlallah, Xavier Garros, Charalambos A. Dimitriadis, Gérard Ghibaudo
Noise-induced dynamic variability in nano-scale CMOS SRAM cells. ESSDERC (2016)
Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Emmanuel Josse, Charalambos A. Dimitriadis, Gérard Ghibaudo
New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs. IRPS (2015)
Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos G. Theodorou, Nicolas Planes, C. A. Dimitriadis, Gérard Ghibaudo
Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. ESSDERC (2014)
Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Franck Arnaud, Jalal Jomaah, Charalambos A. Dimitriadis, Gérard Ghibaudo
Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs. ESSDERC (2012)
Ilias Pappas, Christoforos G. Theodorou, Stylianos Siskos, Charalambos A. Dimitriadis
A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process. ICECS (2009)