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Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs.
Eleftherios G. Ioannidis
Sébastien Haendler
Christoforos G. Theodorou
Nicolas Planes
C. A. Dimitriadis
Gérard Ghibaudo
Published in:
ESSDERC (2014)
Keyphrases
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statistical analysis
dynamic environments
three dimensional
clinical data
neural network
artificial intelligence
image sequences
data structure
dynamically changing
silicon on insulator