Login / Signup

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs.

Christoforos G. TheodorouEleftherios G. IoannidisSébastien HaendlerNicolas PlanesEmmanuel JosseCharalambos A. DimitriadisGérard Ghibaudo
Published in: IRPS (2015)
Keyphrases
  • neural network
  • quantitative analysis
  • machine learning
  • genetic algorithm
  • image analysis